Periodic Table showing typical choices of X-ray lines for EDS operation in the range of accelerating voltages higher than 50 keV. You can download the excel file in order to highlight the elements in your EDS profile. Periodic Table with the X-ray lines most commonly used for EDS analysis. Table 4675f gives the strongest characteristic K-level, L-level, and M-level emission lines for elements with 3 < Z < 95. From Tables 4675b to 4675e, we can know that there are more peak overlaps between elements or more elements which are not detectable at low accelerating voltages. Table 4675a shows the periodic table with the X-ray lines most commonly used for EDS analysis. Each characteristic X-ray line has a specific wavelength or energy. We usually refer to specific characteristic X-rays as ‘lines’ because they originally appeared as lines on photographic plates from early spectrometers. This book (Practical Electron Microscopy and Database) is a reference for TEM and SEM students, operators, engineers, technicians, managers, and researchers.
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